What is "Accelerated Life Testing"?
Accelerated life testing (ALT) is a testing method that predicts the lifetime characteristics of a product under a normal stress level in a short period of time by increasing the stress and combining it with statistical models related to physical failure laws.
Common Accelerated Life Test Types
Significance of Accelerated Life Testing
(1) ALT can shorten the life test cycle.
(2) Test results can be used to evaluate the reliability of electronic products and formulate the basis
(3) Combined with failure analysis, ALT can find the shortcomings of reliability failures.
Commonly Used Accelerated Stresses
Stress in accelerated testing is a broad concept that includes all conditions that affect a product's lifespan. Commonly used stresses include:
(1) Thermal stress (e.g., temperature)
(2) Electrical stress (e.g., voltage, current, power)
(3) Moisture stress (e.g., humidity)
(4) Chemical environment (e.g., gas concentration, salinity)
(5) Mechanical stress (e.g., vibration, friction, pressure, load, frequency)
Censoring Life Testing
Definition: An experimental method wherein an object is tested until a partial failure occurs and the complete life distribution is derived by a statistical analysis of the known failure data.
Classification: Type-I censoring life test and Type-Ⅱ censoring life test
Significance: Shortened testing time